HONERGY TECHNOLOGY Co Limited69b267df-4b10-f011-998a-0022485a07b4_CompanyLogo_07082025

HONERGY TECHNOLOGY Co. Limited

Company

Our company is headed by Prof. Lu Xinhui from the Department of Physics of the Chinese University of Hong Kong as the Chief Scientist. Prof. Zhang Hengkai from the Department of Physics, The Chinese University of Hong Kong as our CTO. Dr. Li Shiang, a graduate of the Department of Physics at the Chinese University of Hong Kong, is our CEO. We currently have two full-time staff members engaged in product R&D, as well as two senior product and technical consultants from the industry.

Description

We are a high-end equipment manufacturing company specializing in advanced X-ray-based non-destructive testing systems. Our cutting-edge solutions are designed for precise analysis and quality control of thin films, including semiconductor, perovskites and organic materials

Product

HONERGY TECHNOLOGY Co LimitedProductImg169b267df-4b10-f011-998a-0022485a07b4_ProductImage1_07082025
HONERGY TECHNOLOGY Co LimitedProductImg269b267df-4b10-f011-998a-0022485a07b4_ProductImage2_07082025
GINDeX: gazing-incidence non-destructive X-ray testing system. the first industrial-scale thin film characterization system utilizing grazing-incidence X-rays scattering, enables rapid, non-destructive crystal and flaw analysis across versatile modern technologies - from perovskite and organic optoelectronics to silicon/gallium-based semiconductor devices, advancing manufacturing quality control and process optimization.

Technology

X-ray scattering analysis on microscopic structure of materials