The IC Failure Analysis Laboratory (ICFAL) provides laboratory services with advanced test equipment to support the product analysis for semiconductor devices and electronic products.
Experienced engineers provide complete IC failure analysis flow including:
Copper Wire decap
– expose backside of Chip
The IC Failure Analysis Laboratory (ICFAL) also provides laboratory services on materials analysis.
Elemental mapping analysis
Field Emission Scanning Electron Microscope
(ZEISS GeminiSEM 300 )