Hong Kong Science & Technology Parks

-	Introduction
-	EDA Centre
-	Data Centre
-	Design Engineering Offices
-	Intellectual Property (IP) Servicing Centre
-	IC Training Centre
-	Multi-Project Wafer Services
-	Enquiry & Booking Form

-	Introduction
-	Probe and Test Development Centre
-	Test Development Service
-	Reliability Tests Service
-	Engineering Sample Test Service
-	Qualification Processing Service
-	Characterization Test Service
-	Wafer Probe Service
-	Low Volume Production Test Service
-	IC Product Analysis Service
-	Enquiry & Booking Form

Photonics Centre

-	Introduction
-	Photonics Development Support Centre
-	Solid State Lighting Laboratory
-	Enquiry & Booking Form

Material Analysis Laboratory

-	Introduction
-	Enquiry & Booking Form

-	Introduction
-	Building Features
-	Shared Equipment Laboratory
-	Support for biotechnology start-up companies
-	Enquiry & Booking Form

-	Introduction
-	3GPP Testing Services
-	Digital Video Broadcasting Testing Services
-	Wireless Technologies Testing Services
-	Enquiry & Booking Form

IC Development Support Centre

Test Development Service

We have a team of experienced engineers to provide the following services:

• Test program development for digital, mixed-signal, RF and memory products

• Loadboard design

• Probe card design

• Characterization program development

• Tester platform conversion

• Production yield analysis and yield improvement

• Test time reduction

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